Peidous, I.: search on Z-Library

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1

[IEEE 2014 20th International Conference on Ion Implantation Technology (IIT) - Portland, OR, USA (2014.6.26-2014.7.4)] 2014 20th International Conference on Ion Implantation Technology (IIT) - Comparison of spot and wide beam implanters for making SOI wafers by layer transfer

Jost, Z., Jones, A., Lottes, C., Peidous, I., Ries, M., Usenko, A.

Year:

2014

Language:

english

File:

PDF, 391 KB

english, 2014

2

[IEEE 1997 6th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (21-25 July 1997)] Proceedings of the 1997 6th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Methodology for ULSI LOCOS isolation built-in reliability analysis

Loiko, K.V., Peidous, I.V., Hok-Min Ho,, Quek, E.K.B., Lim, D.H.Y.

Year:

1997

Language:

english

File:

PDF, 393 KB

english, 1997

3

[ECS 210th ECS Meeting - Cancun, Mexico (October 29-November 3, 2006)] ECS Transactions - Sidewall Dislocations in Embedded SiGe Source/Drain Areas of MOSFETs and Their Impact on the Device Performance

Kammler, Thorsten, Peidous, Igor, Wei, Andy, Reichel, Carsten, Heinemann, Stefan, Romero, Karla, Engelmann, Hans-Juergen

Year:

2006

Language:

english

File:

PDF, 987 KB

english, 2006

4

[IEEE 2012 IEEE Symposium on VLSI Technology - Honolulu, HI, USA (2012.06.12-2012.06.14)] 2012 Symposium on VLSI Technology (VLSIT) - Replacement metal gate extendible to 11 nm technology

Yoshida, Naomi, Fu, Xinyu, Xu, Kun, Lei, Yu, Yang, Haichun, Sun, Shiyu, Chen, Hao, Darlak, Andrew, Donohoe, Ray, Lazik, Christopher, Jakkaraju, Rajkumar, Noori, Atif, Hung, Steven, Peidous, Igor, Chan

Year:

2012

Language:

english

File:

PDF, 1.11 MB

english, 2012

5

[IEEE 2007 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) - Hsinchu, Taiwan (2007.04.23-2007.04.25)] 2007 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) - Implementation of Robust Nickel Alloy Salicide Process for High-Performance 65nm SOI CMOS Manufacturing

Strane, Jay, Brown, David, Lavoie, Christian, Suenaga, Jun, Haran, Bala, Press, Patrick, Besser, Paul, Flaitz, Philip, Gribelyuk, Michael, Kammler, Thorsten, Peidous, Igor, Chen, Huajie, Waidmann, Ste

Year:

2007

Language:

english

File:

PDF, 927 KB

english, 2007

6

The Effect of Intrinsic Point Defects upon Dislocation Motion in Silicon

Peidous, I.V., Loiko, K.V., Simpson, D.A., Frensley, W.R., Huff, Howard R.

Journal:

Solid State Phenomena

Year:

2002

File:

PDF, 639 KB

2002

7

SOI and Bulk FinFET Alternatives from the Perspective of Strain Engineering

Peidous, I. V., Lottes, C., Jost, C.

Journal:

ECS Transactions

Year:

2014

Language:

english

File:

PDF, 845 KB

english, 2014

8

Edge Effects of Nitride Film Patterning on Dislocation Generation in Local Oxidation of Silicon

Peidous, I. V., Sundaresan, R., Quek, E., Lau, C. K.

Journal:

MRS Proceedings

Year:

1998

Language:

english

File:

PDF, 2.00 MB

english, 1998

9

SPIE Proceedings [SPIE Microelectronic Manufacturing - Austin, TX (Wednesday 1 October 1997)] Microelectronic Device Technology - Narrow-channel transistor threshold self-adjustment technique for ULSI with LOCOS isolation

Loiko, Konstantin V., Peidous, Igor V., Ho, Hok-Min, Bromley-Barratt, John F., Quek, Elgin T., Lim, David H. Y., Rodder, Mark, Tsuchiya, Toshiaki, Burnett, David, Wristers, Dirk

Year:

1997

Language:

english

File:

PDF, 85 KB

english, 1997

10

Active corner engineering in the process integration for shallow trench isolation

N. Balasubramanian, E. Johnson, I. V. Peidous, S. Ming-jr, R. Sundaresan

Year:

2000

Language:

english

File:

PDF, 684 KB

english, 2000

11

AIP Conference Proceedings [AIP ION IMPLANTATION TECHNOLOGY 2012: Proceedings of the 19th International Conference on Ion Implantation Technology - Valladolid, Spain (25–29 June 2012)] - NMOS contact resistance reduction with selenium implant into NiPt silicide

Rao, K. V., Khaja, F. A., Ni, C. N., Muthukrishnan, S., Darlark, A., Lei, J., Peidous, I., Brand, A., Henry, T., Variam, N., Erokhin, Y.

Year:

2012

Language:

english

File:

PDF, 1.03 MB

english, 2012

12

Impact of Silicon Wafer Material on Dislocation Generation in Local Oxidation

Peidous, I. V., Sundaresan, R., Quek, E., Leung, Y. K., Beh, M.

Journal:

MRS Proceedings

Year:

1998

Language:

english

File:

PDF, 1.31 MB

english, 1998

13

The Impact of Point Defects on Stress-Induced Dislocation Generation in Silicon

Loiko, Konstantin V., Nallapati, Giri, Jarreau, Keith M., Ekbote, Shashank S., Hensley, Roy A., Simpson, Dale, Harrington, Thomas E., Frensley, William R., Peidous, Igor V.

Journal:

MRS Proceedings

Year:

2000

Language:

english

File:

PDF, 535 KB

english, 2000

14

[ECS 214th ECS Meeting - Honolulu, HI (October 12 - October 17, 2008)] ECS Transactions - The Effect of Silicide Processing on Stress Reduction in Silicon Device Structures with Strained SiGe Elements

Peidous, Igor, Press, Patrick

Year:

2008

Language:

english

File:

PDF, 265 KB

english, 2008

15

Stress-Induced Redistribution of Point Defects in Silicon Device Structures

Loiko, K.V., Peidous, I.V., Harrington, T.E., Frensley, W.R.

Journal:

Solid State Phenomena

Year:

2002

File:

PDF, 489 KB

2002

16

SPIE Proceedings [SPIE Microelectronic Manufacturing '99 - Santa Clara, CA (Wednesday 22 September 1999)] Microelectronic Device Technology III - Stress-induced leakage currents of CMOS ULSI devices with shallow trench isolation

Sundaresan, Ravi, Gan, Chock H., Peidous, Igor V., Burnett, David, Tsuchiya, Toshiaki

Year:

1999

Language:

english

File:

PDF, 784 KB

english, 1999

17

AIP Conference Proceedings [AIP ION IMPLANTATION TECHNOLOGY 2012: Proceedings of the 19th International Conference on Ion Implantation Technology - Valladolid, Spain (25–29 June 2012)] - Schottky barrier height tuning using P+ DSS for NMOS contact resistance reduction

Khaja, Fareen Adeni, Rao, K. V., Ni, Chi-Nung, Muthukrishnan, Shankar, Lei, Jianxin, Darlark, Andrew, Peidous, Igor, Brand, Adam, Henry, Todd, Variam, Naushad

Year:

2012

Language:

english

File:

PDF, 394 KB

english, 2012

18

Dislocation Locking by Intrinsic Point Defects in Silicon

Peidous, Igor V., Loiko, Konstantin V., Simpson, Dale A., La, Tony, Frensley, William R.

Journal:

MRS Proceedings

Year:

2001

Language:

english

File:

PDF, 140 KB

english, 2001

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